Edge effect on thermally excited mag-noise in magnetic tunnel junction sensors

IEEE Transactions on Magnetics

Volumn 48, Issue 11, 2012, Pages 2831-2834

  Zeng, T ^a   Zhou, Y ^a   Lin, K W ^b   Lai, P T ^a   Pong, P W T ^a  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

^b NATIONAL CHUNG HSING UNIVERSITY   (Taiwan)

Author keywords

Applied field; Edges; Free layer (FL); Hard bias field; Magnetic tunnel junction (MTJ); Spatial distribution; Thermal mag noise

Indexed keywords

APPLIED FIELD; BIAS FIELD; EDGES; FREE LAYERS; MAG-NOISE; MAGNETIC TUNNEL JUNCTION;

SENSORS; SPATIAL DISTRIBUTION;

MAGNETIC DEVICES;

EID: 84867769129     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2012.2198201     Document Type: Article

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