Modeling of thermal magnetization fluctuations in thin-film magnetic devices

Journal of Applied Physics

Volumn 90, Issue 11, 2001, Pages 5768-5773

  Smith, Neil ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035576298     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1402146     Document Type: Article

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