Improved step stress accelerated life testing method for electronic product

Microelectronics Reliability

Volumn 52, Issue 11, 2012, Pages 2773-2780

  Qingchuan, He ^a   Wenhua, Chen ^a   Jun, Pan ^a   Ping, Qian ^a  

^a ZHEJIANG SCI TECH UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATED LIFE TESTING; ELECTRONIC PRODUCT; HIGH STRESS; LOW STRESS; NUMBER OF SAMPLES; RESOURCE LIMITATIONS; STEP-STRESS; STRESS LEVELS; TEST EQUIPMENTS;

EQUIPMENT TESTING;

AVAILABILITY;

EID: 84867573039     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2012.04.003     Document Type: Article

References (14)

1. W.Q. Wang, M. Azarian, and M. Pecht Qualific for Prod Develop, ICEPT-HDP 2008 1 12
2. W.B. Nelson Accelerated testing: statistical models, test plans, and data analysis 2004 John Wiley & Sons Inc New York
3. M. Pecht Prognostics and health management of electronics 2008 John Wiley & Sons Inc New York
4. Q.C. He, W.H. Chen, J. Pan, and S.J. Wang Challenges in reliability assessment for electronics Adv Mater Res 118-120 2010 419 423
5. J. Qin A new physics-of-failure based VLSI circuits reliability simulation and prediction methodology 2007 University of Maryland USA
6. E.M. Monroe Optimal experimental designs for accelerated life tests with censoring and constraints 2009 Arizona State University USA
7. C.H. Li Optimal step-stress plans for accelerated life testing considering reliability-life prediction 2009 Northeaster University Boston USA
8. H.M. Ma New developments in planning accelerated life tests 2009 Iowa State University USA
9. J.W. McPherson Reliability physics and engineering: time-to-failure modeling 2010 Springer New York
10. G.S. Wasserman Reliability verification, testing, and analysis in engineering design 2003 Marcel Dekker Inc New York
11. H.Y. Qi, S. Ganesan, and M. Pecht No-fault-found and intermittent failures in electronic products Microelectron Reliab 48 2008 663 674
12. W.Q. Meeker, and L.A. Escobar Statistical methods for reliability data 1998 John Wiley & Sons Inc New York
13. Wikipedia, Switched-mode power supply; February 1, 2012. < http://en.wikipedia.org/wiki/Switching-power-supply > [accessed 18.02.12].
14. Wikipedia, Capacitor plague; February 11, 2012. < http://en.wikipedia. org/wiki/Capacitor-plague > [accessed 18.02.12].