Deterministic order in surface micro-topologies through sequential wrinkling

Advanced Materials

Volumn 24, Issue 40, 2012, Pages 5441-5446

  Yin, Jie ^a   Yagüe, Jose Luis ^a   Eggenspieler, Damien ^a   Gleason, Karen K ^a   Boyce, Mary C ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

copolymer coatings; iCVD; micropatterns; modulus measurement; sequential wrinkling; thin films

Indexed keywords

CO-POLYMER COATINGS; ICVD; MICROPATTERNS; MODULUS MEASUREMENTS; SEQUENTIAL WRINKLING;

MATERIALS SCIENCE; THIN FILMS;

MECHANICAL PROPERTIES;

2 HYDROXYETHYL METHACRYLATE; BAYSILON; DIMETICONE; GOLD; METHACRYLIC ACID DERIVATIVE;

ARTICLE; CHEMISTRY; ELASTICITY; ELECTRONICS; INTERFEROMETRY; LIGHT; MICROFLUIDIC ANALYSIS; SURFACE PROPERTY;

DIMETHYLPOLYSILOXANES; ELASTICITY; ELECTRONICS; GOLD; INTERFEROMETRY; LIGHT; METHACRYLATES; MICROFLUIDIC ANALYTICAL TECHNIQUES; SURFACE PROPERTIES;

EID: 84867523663     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201201937     Document Type: Article

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