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Volumn 41, Issue 43, 2012, Pages 13520-13524

Synthesis and characterization of compounds with the Al-O-X (X = Si, P, C) structural motif

Author keywords

[No Author keywords available]

Indexed keywords

SILICON; X RAY DIFFRACTION;

EID: 84867500142     PISSN: 14779226     EISSN: 14779234     Source Type: Journal    
DOI: 10.1039/c2dt31872e     Document Type: Article
Times cited : (25)

References (44)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.