Chemistry and atomic distortion at the surface of an epitaxial BaTiO 3 thin film after dissociative adsorption of water

Journal of Physical Chemistry C

Volumn 116, Issue 41, 2012, Pages 21802-21809

  Wang, J L ^a   Gaillard, F ^b   Pancotti, A ^c   Gautier, B ^d   Niu, G ^e   Vilquin, B ^e   Pillard, V ^f   Rodrigues, G L M P ^g   Barrett, N ^a  

^a les Atomes et les Molecules   (France)

^b UNIVERSITÉ LYON 1   (France)

^c UNIVERSITY OF CAMPINAS   (Brazil)

^d UNIVERSITÉ DE LYON   (France)

^e ECOLE CENTRALE DE LYON   (France)

^f UNIVERSITÉ PARIS SACLAY   (France)

^g LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LAYER; BATIO; DESORPTION ENERGY; DISSOCIATIVE ADSORPTION; EPITAXIAL QUALITY; HIGH RESOLUTION; HIGH WATER; MOLECULAR ADSORPTION; QUANTITATIVE LOW-ENERGY ELECTRON DIFFRACTION; SCATTERING SIMULATIONS; SRTIO; SURFACE DIPOLE; SURFACE LATTICE; SURFACE OXYGEN VACANCIES; TI ATOMS; TIO;

ATOMIC FORCE MICROSCOPY; BARIUM COMPOUNDS; CHEMISORPTION; EPITAXIAL FILMS; EPITAXIAL GROWTH; LOW ENERGY ELECTRON DIFFRACTION; OXYGEN VACANCIES; PHOTOELECTRONS; PHYSISORPTION; POLARIZATION; SURFACE CHEMISTRY; TEMPERATURE PROGRAMMED DESORPTION; TITANIUM DIOXIDE; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

DISSOCIATION;

EID: 84867498823     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp305826e     Document Type: Article

References (38)

1. Henderson, M. A. Surf. Sci. Rep. 2002, 46, 1-308
2. Hodgson, A.; Haq, S. Surf. Sci. Rep. 2009, 64, 381-451
3. Henderson, M. A. Surf. Sci. Rep. 2011, 66, 185-297
4. Evarestov, R. A.; Bandura, A. V.; Alexandrov, V. E. Surf. Sci. 2007, 601, 1844-1856
5. Lohokare, S. P.; Crane, E. L.; Dubois, L. H.; Nuzzo, R. G. J. Chem. Phys. 1998, 108, 8640
6. Brown, D. E. Science 1998, 279, 542-544
7. Li, D.; Zhao, M. H.; Garra, J.; Kolpak, A. M.; Rappe, A. M.; Bonnell, D. A.; Vohs, J. M. Nat. Mater. 2008, 7, 473-7
8. Wendt, S.; Matthiesen, J.; Schaub, R.; Vestergaard, E. K.; Lgsgaard, E.; Besenbacher, F.; Hammer, B. Phys. Rev. Lett. 2006, 96, 066107
9. Shin, J.; Nascimento, V. B.; Geneste, G.; Rundgren, J.; Plummer, E. W.; Dkhil, B.; Kalinin, S. V.; Baddorf, A. P. Nano Lett. 2009, 9, 3720-5
10. Geneste, G.; Dkhil, B. Phys. Rev. B 2009, 79, 235420
11. Garra, J.; Vohs, J.; Bonnell, D. Surf. Sci. 2009, 603, 1106-1114
12. Kim, H. G.; Hwang, D. W.; Lee, J. S. J. Am. Chem. Soc. 2004, 126, 8912-3
13. Kim, H. G.; Hwang, D. W.; Kim, J.; Kim, Y. G.; Lee, J. S. Chem. Commun. 1999, 2, 1077-1078
14. Zhao, M. H.; Bonnell, D. A.; Vohs, J. M. Surf. Sci. 2008, 602, 2849-2855
15. Park, C.; Chadi, D. Phys. Rev. Lett. 2000, 84, 4717-20
16. Fong, D. D. Phys. Rev. Lett. 2006, 96, 127601
17. van Hove, M. A.; Weinberg, W. H.; Chan, C. M. Low-Energy Electron Diffraction: Experiment, Theory and Surface Structure Determination; Springer Series in Surface Sciences 6; Springer-Verlag: New York, 1986.
18. Kawasaki, M.; Takahashi, K.; Maeda, T.; Tsuchiya, R.; Shinohara, M.; Ishiyama, O.; Yonezawa, T.; Yoshimoto, M.; Koinuma, H. Science 1994, 266, 1540-1542
19. Niu, G.; Yin, S.; Saint-Girons, G.; Gautier, B.; Lecoeur, P.; Pillard, V.; Hollinger, G.; Vilquin, B. Microelectron. Eng. 2011, 88, 1232-1235
20. Barbieri, A.; Van Hove, M. A. SATLEED Package. http://www.ap.cityu.edu. hk/personal-website/Van-Hove-files/leed/leedpack.html (accessed March 2012).
21. Harada, J.; Pedersen, T.; Barnea, Z. Acta Crystallogr., Sect. A 1970, 26, 336-344
22. Pendry, J. B. J. Phys. C: Solid State Phys. 1980, 13, 937
23. Fairley, N. CasaXPS, 2009. http://www.casaxps.com/ (accessed March 2012).
24. Joly, J.; Gaillard, F.; Peillex, E.; Romand, M. Vacuum 2000, 59, 854-867
25. Thiel, P. A.; Madey, T. E. Surf. Sci. Rep. 1987, 7, 211-385
26. Du, Y.; Petrik, N. G.; Deskins, N. A.; Wang, Z.; Henderson, M. A.; Kimmel, G. A.; Lyubinetsky, I. Phys. Chem. Chem. Phys. 2012, 14, 3066-3074
27. Cheng, B. L.; Button, T. W.; Gabbay, M.; Fantozzi, G.; Maglione, M. J. Am. Ceram. Soc. 2005, 88, 907-911
28. Baniecki, J. D.; Ishii, M.; Shioga, T.; Kurihara, K.; Miyahara, S. Appl. Phys. Lett. 2006, 89, 162908
29. Fuenzalida, V. M.; Pilleux, M. E.; Eisele, I. Vacuum 1999, 55, 81-83
30. NIST Electron Inelastic-Mean-Free-Path Database, version 1.2; Powell, C. J.; Jablonski, A., Eds.; National Institute of Standards and Technology: Gaithersburg, MD, 2010.
31. Wendt, S. Surf. Sci. 2005, 598, 226-245
32. Kobayashi, Y. Nat. Mater. 2012, 11, 1-5
33. Redhead, P. A. Vacuum 1962, 12, 203-211
34. Habenschaden, E.; Küppers, J. Surf. Sci. 1984, 138, L147-L150
35. Papageorgiou, A. C.; Beglitis, N. S.; Pang, C. L.; Teobaldi, G.; Cabailh, G.; Chen, Q.; Fisher, A. J.; Hofer, W. A.; Thornton, G. Proc. Natl. Acad. Sci. 2010, 107, 2391-6
36. Choi, G. J.; Kim, H. S.; Cho, Y. S. Mater. Lett. 1999, 41, 122-127
37. Ghosez, P.; Michenaud, J.-P.; Gonze, X. Phys. Rev. B 1998, 58, 6224-6240
38. Wang, J. L.; Pancotti, A.; Jégou, P.; Niu, G.; Gautier, B.; Mi, Y. Y.; Tortech, L.; Yin, S.; Vilquin, B.; Barrett, N. Phys. Rev. B 2011, 84, 205426