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Volumn 48, Issue 20, 2012, Pages 1306-1308
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Carrier transport properties of Mg-doped InAlN films
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT-VOLTAGE MEASUREMENTS;
DEEP-LEVEL DEFECTS;
ELECTRICAL RESISTIVITY;
HOPPING CONDUCTION;
METAL CONTACTS;
MG-DOPING;
TEMPERATURE DEPENDENT;
TRANSMISSION LINE MODELS;
CARRIER TRANSPORT;
ELECTRIC CONDUCTIVITY;
INTERFACE STATES;
TRANSMISSION LINE THEORY;
TRANSPORT PROPERTIES;
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EID: 84867061804
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el.2012.2238 Document Type: Article |
Times cited : (7)
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References (6)
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