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Volumn 83, Issue 9, 2012, Pages

Depth profiling and imaging capabilities of an ultrashort pulse laser ablation time of flight mass spectrometer

Author keywords

[No Author keywords available]

Indexed keywords

DATA ACQUISITION SOFTWARES; DATA ACQUISITION SYSTEM; FS PULSE; IMAGING CAPABILITIES; MASS SPECTRA; MICRON-SCALE RESOLUTION; PULSE LASER ABLATION; SEMI-CONDUCTOR WAFER; TI: SAPPHIRE LASER;

EID: 84867025835     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4750974     Document Type: Review
Times cited : (33)

References (35)
  • 3
    • 26044449052 scopus 로고    scopus 로고
    • 10.1016/j.mla.2005.07.005
    • S. Maxwell and E. Mazur, Med. Laser Appl. 20, 193 (2005). 10.1016/j.mla.2005.07.005
    • (2005) Med. Laser Appl. , vol.20 , pp. 193
    • Maxwell, S.1    Mazur, E.2
  • 18
    • 77949863848 scopus 로고    scopus 로고
    • 10.1039/b925579f
    • D. J. Weston, Analyst 135, 661 (2010). 10.1039/b925579f
    • (2010) Analyst , vol.135 , pp. 661
    • Weston, D.J.1
  • 25
    • 0012787540 scopus 로고
    • 10.1063/1.1718927
    • R. E. Pawel, Rev. Sci. Instrum. 35, 1066 (1964). 10.1063/1.1718927
    • (1964) Rev. Sci. Instrum. , vol.35 , pp. 1066
    • Pawel, R.E.1
  • 35
    • 84866996969 scopus 로고    scopus 로고
    • See supplementary material at http://dx.doi.org/10.1063/1.4750974 E-RSINAK-83-037209 for laser beam profile and optical resolution of AToF-MS.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.