Metal contacts to MoS 2: A two-dimensional semiconductor

Device Research Conference - Conference Digest, DRC

Volumn , Issue , 2012, Pages 65-66

  Neal, Adam T ^a   Liu, Han ^a   Gu, J J ^a   Ye, P D ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE-SCALING; ELECTROSTATIC CONTROL; FIELD-EFFECT DEVICES; LARGE BAND; LOW DIMENSIONAL STRUCTURE; METAL CONTACTS; N-DOPED; OFF-CURRENT; PD CONTACTS; SCHOTTKY BEHAVIORS; TRANSFER LENGTH METHODS;

ELECTRIC CONTACTORS; ELECTROSTATICS; GRAPHENE; OHMIC CONTACTS; PALLADIUM; TRANSISTORS;

MOLYBDENUM COMPOUNDS;

EID: 84866897676     PISSN: 15483770     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DRC.2012.6256928     Document Type: Conference Paper

References (3)

1. B. Radisavljevic et al, Nature Nanotechnology, 6, 147 (2011).
2. I. Popov et al, Physcial Review Letters, 108 (2012).
3. H. Liu and P.D. Ye, IEEE Electron Device Letters (in press).