A study of the electronic structure of FeSe1-xTex chalcogenides by Fe and Se K-edge x-ray absorption near edge structure measurements

Journal of Physics Condensed Matter

Volumn 22, Issue 48, 2010, Pages

  Joseph, B ^a   Iadecola, A ^a   Simonelli, L ^b   Mizuguchi, Y ^c,d   Takano, Y ^c,d   Mizokawa, T ^e   Saini, N L ^a,e  

^a UNIVERSITÀ DI ROMA LA SAPIENZA   (Italy)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^d JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^e UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHALCOGENS; FE K-EDGE; ORBITALS; POLARIZATION DEPENDENCE; WHITE LINES; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; X-RAY POLARIZATIONS; XANES;

ABSORPTION; ABSORPTION SPECTRA; CHALCOGENIDES; DENSITY FUNCTIONAL THEORY; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; PHASE CHANGE MEMORY; POLARIZATION; X RAY ABSORPTION; X RAY ANALYSIS; X RAYS;

TELLURIUM COMPOUNDS;

EID: 78649828735     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/22/48/485702     Document Type: Article

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