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Volumn , Issue , 2012, Pages 1250-1254

Advanced low profile PoP solution with embedded wafer level PoP (eWLB-PoP) technology

Author keywords

[No Author keywords available]

Indexed keywords

3D PACKAGING; 3D TECHNOLOGY; APPLICATION PROCESSORS; ASSEMBLY PROCESS; BOARD-LEVEL RELIABILITY; BUILDING BLOCKES; COMPONENT PACKAGING; DEVICE DESIGN; ENABLING TECHNOLOGIES; FORM FACTORS; FUNCTIONAL INTEGRATION; INTERCONNECTION DENSITY; MECHANICAL CHARACTERIZATIONS; MOBILE APPLICATIONS; NEW TECHNOLOGY DEVELOPMENT; PACKAGE CONFIGURATIONS; PACKAGE RELIABILITY; PACKAGE SIZE; PACKAGE STRUCTURE; PORTABLE ELECTRONICS; RELIABILITY CHARACTERIZATION; SIGNAL ROUTING; SYSTEM LEVEL INTEGRATION; TEST VEHICLE; TOP SURFACE; WAFER LEVEL;

EID: 84866839778     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2012.6248995     Document Type: Conference Paper
Times cited : (46)

References (4)
  • 2
    • 68149157395 scopus 로고    scopus 로고
    • Good things in small packages
    • Graham pitcher, 23 June 2009
    • Graham pitcher, "Good things in small packages," Newelectronics, 23 June 2009, p18-19 ( 2009)
    • (2009) Newelectronics , pp. 18-19


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.