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Volumn , Issue , 2012, Pages 1250-1254
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Advanced low profile PoP solution with embedded wafer level PoP (eWLB-PoP) technology
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Author keywords
[No Author keywords available]
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Indexed keywords
3D PACKAGING;
3D TECHNOLOGY;
APPLICATION PROCESSORS;
ASSEMBLY PROCESS;
BOARD-LEVEL RELIABILITY;
BUILDING BLOCKES;
COMPONENT PACKAGING;
DEVICE DESIGN;
ENABLING TECHNOLOGIES;
FORM FACTORS;
FUNCTIONAL INTEGRATION;
INTERCONNECTION DENSITY;
MECHANICAL CHARACTERIZATIONS;
MOBILE APPLICATIONS;
NEW TECHNOLOGY DEVELOPMENT;
PACKAGE CONFIGURATIONS;
PACKAGE RELIABILITY;
PACKAGE SIZE;
PACKAGE STRUCTURE;
PORTABLE ELECTRONICS;
RELIABILITY CHARACTERIZATION;
SIGNAL ROUTING;
SYSTEM LEVEL INTEGRATION;
TEST VEHICLE;
TOP SURFACE;
WAFER LEVEL;
APPROXIMATION THEORY;
ELECTRONIC EQUIPMENT;
ELECTRONICS PACKAGING;
RELIABILITY;
TECHNOLOGY;
THREE DIMENSIONAL COMPUTER GRAPHICS;
PACKAGING;
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EID: 84866839778
PISSN: 05695503
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ECTC.2012.6248995 Document Type: Conference Paper |
Times cited : (46)
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References (4)
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