Model tests of electrical compensation method for the new calculable cross capacitor at NIM

CPEM Digest (Conference on Precision Electromagnetic Measurements)

Volumn , Issue , 2012, Pages 462-463

  Lu, Huang ^a   Small, G W ^b   Lu, Zuliang ^a   Fiander, J R ^b   Yan, Yang ^a  

^a NATIONAL INSTITUTE OF METROLOGY   (China)

^b NATIONAL MEASUREMENT INSTITUTE   (Australia)

Author keywords

Close approach nonlinearity; Electrical end; End effect error; Modified active nosepiece; Nosepiece

Indexed keywords

ELECTRICAL END; END EFFECTS; MODIFIED ACTIVE NOSEPIECE; NON-LINEARITY; NOSEPIECE;

CAPACITORS; ELECTRODES; ELECTROMAGNETISM; GEOMETRY;

CAPACITANCE MEASUREMENT;

EID: 84866790575     PISSN: 05891485     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CPEM.2012.6251003     Document Type: Conference Paper

References (4)

1. W. K. Clothier, "A calculable standard of capacitance," Metrologia, vol. 1, p.36-55, 1965.
2. A. Jeffery, L. H. Lee, and J. Q. Shields, "Model tests to investigate the effects of geometrical imperfections on the NIST calculable capacitor," IEEE Trans. Instrum. Meas., vol. 48, p.356-359, 1999.
3. G. W. Small, "Fabrication of the main electrodes of the NMIA-BIPM calculable capacitor," CPEM 2010 Conf. Digest, p. 543-544, 2010.
4. Z. H. Zhang and Z. L. Lu, "A new method for reducing the end-effect error of the cross-capacitor with a movable guard rod," Acta Metrologica Sinica., vol. 3, pp.250-258, 1982