Model tests to investigate the effects of geometrical imperfections on the NIST calculable capacitor

IEEE Transactions on Instrumentation and Measurement

Volumn 48, Issue 2, 1999, Pages 356-359

  Jeffery, Anne Marie ^a,b   Lee, Lai H ^b   Shields, John Q ^b  

^a IEEE   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Calculable capacitor; Capacitance measurements

Indexed keywords

EID: 0042160342     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.769600     Document Type: Article

References (6)

1. A.M. Thompson and D. G. Lampard, Nature, vol. 177, p. 888, 1956.
2. R.D. Cutkosky, "New NBS measurements of the absolute Farad and ohm," IEEE Trans. Instrum. Meas., vol. IM-23, pp. 305-309, Dec. 1974.
3. J.Q. Shields, R. F. Dziuba, and H. Layer, "New realization of the Ohm and Farad using the NIST calculable capacitor," IEEE Trans. Instrum. Meas., vol. 38, pp. 249-251, Apr. 1989.
4. A. Jeffery, R. E. Elmquist, L. H. Lee, J. Q. Shields, and R. F. Dziuba, "NIST comparison of the quantized Hall resistance of the SI ohm through the calculable capacitor," IEEE Trans. Instrum. Meas., vol. 46, pp. 264-268, Apr. 1997.
5. W.K. Clothier, "A calculable standard of capacitance," Metrologia, vol. 1, pp. 36-55, Apr. 1965.
6. T. Igarashi, Y. Koizumi, and M. Kanno, "Determination of an absolute capacitance by a horizontal cross capacitor," IEEE Trans. Instrum. Meas., vol. IM-17, pp. 226-231, 1968.