Coating thickness determination in highly absorbent core-shell systems

Journal of Applied Crystallography

Volumn 45, Issue 5, 2012, Pages 906-913

  Palancher, Herve ^a   Bonnin, Anne ^a,b   Honkimäki, Veijo ^b   Suhonen, Heikki ^b   Cloetens, Peter ^b   Zweifel, Tobias ^a,c   Tucoulou, Rémi ^b   Rack, Alexander ^b   Voltolini, Marco ^b,d  

^a DIF   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^d UNIVERSITY OF PADOVA   (Italy)

Author keywords

high energy X ray diffraction; low enriched nuclear fuels; nanotomography; powder diffraction; Rietveld refinement

Indexed keywords

COATING THICKNESS; CORE-SHELL; HIGH ENERGY X-RAY DIFFRACTION; LASER GRANULOMETRY; NANOTOMOGRAPHY; POTENTIAL APPLICATIONS; POWDER DIFFRACTION; PROTECTIVE LAYERS; SHELL THICKNESS; SINGLE PARTICLE; SINGLE-SHOT; TEST SAMPLES; UMO ALLOY; X-RAY NANOTOMOGRAPHY;

NUCLEAR FUELS; RIETVELD REFINEMENT; SHELLS (STRUCTURES); THICKNESS MEASUREMENT; X RAY DIFFRACTION;

COATINGS;

EID: 84866547330     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889812031159     Document Type: Article

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