Laser beam scanning microscope and piezoresponse force microscope studies on domain structured in 001-, 110-, and 111-oriented NaNbO 3 films

Journal of Applied Physics

Volumn 112, Issue 5, 2012, Pages

  Yamazoe, Seiji ^a   Kohori, Akihiro ^a   Sakurai, Hiroyuki ^a   Kitanaka, Yuuki ^b   Noguchi, Yuji ^b   Miyayama, Masaru ^b   Wada, Takahiro ^a  

^a RYUKOKU UNIVERSITY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANTI FERROELECTRICS; DIELECTRIC BEHAVIOR; DOMAIN STRUCTURE; EPITAXIALLY GROWN; FERROELASTICITY; LASER BEAM SCANNING; PIEZO-RESPONSE FORCE MICROSCOPES; PIEZOELECTRIC DOMAINS; PIEZORESPONSE; POLARIZATION AXES; SRTIO;

ANTIFERROELECTRICITY; LASER BEAMS; SUBSTRATES;

MICROSCOPES;

EID: 84866429088     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4746079     Document Type: Conference Paper

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