Electron and hole Hong-Ou-Mandel interferometry

Physical Review B - Condensed Matter and Materials Physics

Volumn 86, Issue 12, 2012, Pages

  Jonckheere, T ^a,b   Rech, J ^a   Wahl, C ^a   Martin, T ^a  

^a AIX MARSEILLE UNIVERSITY   (France)

^b UNIVERSITÉ DE TOULON   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84866370675     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.86.125425     Document Type: Article

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