Back-focal-plane position detection with extended linear range for photonic force microscopy

Applied Optics

Volumn 51, Issue 25, 2012, Pages 5973-5977

  Martínez, Ignacio A ^a   Petrov, Dmitri ^a,b  

^a ICFO INSTITUT DE CIENCIES FOTONIQUES   (Spain)

^b INSTITUCIÓ CATALANA DE RECERCA I ESTUDIS AVANÇATS ICREA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

FOCUSING;

ABSOLUTE POSITION; HIGH NUMERICAL APERTURES; PHOTONIC FORCE MICROSCOPE; PHOTONIC FORCE MICROSCOPY; POSITION DETECTION; QUADRANT POSITION DETECTORS; RESTRICTED REGIONS; TEMPORAL AND SPATIAL;

PROBES;

MICROSPHERE;

ARTICLE; ATOMIC FORCE MICROSCOPY; EQUIPMENT DESIGN; INSTRUMENTATION; METHODOLOGY; OPTICAL TWEEZERS; PARTICLE SIZE;

EQUIPMENT DESIGN; MICROSCOPY, ATOMIC FORCE; MICROSPHERES; OPTICAL TWEEZERS; PARTICLE SIZE;

EID: 84866342655     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.51.005973     Document Type: Article

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