-
1
-
-
33244454403
-
-
SurfaceSpectra Ltd/I M Publications, Eds., Briggs, D., Grant, J.T., National Physical Laboratory: Teddington, U.K
-
Seah, M.P. Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy. SurfaceSpectra Ltd/I M Publications, Eds., Briggs, D., Grant, J.T., National Physical Laboratory: Teddington, U.K., 2003, pp. 167–189.
-
(2003)
Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy
, pp. 167-189
-
-
Seah, M.P.1
-
3
-
-
0036692774
-
Fine determination of inter-atomic distances on surface using extended energy-loss fine structure (EELFS) data: Peculiarities of the technique
-
Wainstein, D.L., Kovalev, A.I. Fine determination of inter-atomic distances on surface using extended energy-loss fine structure (EELFS) data: peculiarities of the technique. Surface and Interface Analysis 2002, 34, 230–233.
-
(2002)
Surface and Interface Analysis
, vol.34
, pp. 230-233
-
-
Wainstein, D.L.1
Kovalev, A.I.2
-
4
-
-
0000014708
-
Auger and x-ray photoelectron spectroscopy
-
Eds., Briggs, D., Seah, M.P. John Wiley and Sons: Chichester
-
Sherwood, P.M.A. Auger and x-ray photoelectron spectroscopy. In Practical Surface Analysis, Auger and X-Ray Photoelectron Spectroscopy, 2nd ed., Vol. 1, Eds., Briggs, D., Seah, M.P. John Wiley and Sons: Chichester, 1990, p. 555.
-
(1990)
Practical Surface Analysis, Auger and X-Ray Photoelectron Spectroscopy
, vol.1
, pp. 555
-
-
Sherwood, P.M.A.1
-
5
-
-
0025632622
-
EELFS method for investigation of equilibrium segregations on surfaces in steel and alloys
-
Kovalev, A.I., Mishina, V.P., Stsherbedinsky, G.V., Wainstein, D.L. EELFS method for investigation of equilibrium segregations on surfaces in steel and alloys. Vacuum 1990, 41, 7–9, 1794–1795.
-
(1990)
Vacuum
, vol.41
, Issue.7-9
, pp. 1794-1795
-
-
Kovalev, A.I.1
Mishina, V.P.2
Stsherbedinsky, G.V.3
Wainstein, D.L.4
-
7
-
-
0010498987
-
Investigation of atomic and electronic structure of films generated on a cutting tool surface
-
Kovalev, A.I., Wainstein, D.L., Mishina, V.P., Fox-Rabinovich, G.S. Investigation of atomic and electronic structure of films generated on a cutting tool surface. Journal of Electron Spectroscopy and Related Phenomena 1999, 105, 63–75.
-
(1999)
Journal of Electron Spectroscopy and Related Phenomena
, vol.105
, pp. 63-75
-
-
Kovalev, A.I.1
Wainstein, D.L.2
Mishina, V.P.3
Fox-Rabinovich, G.S.4
-
8
-
-
0000881743
-
Secondary ion mass spectroscopy: The surface mass spectrometry
-
Ed., Vickerman, J.C. John Wiley & Sons: New York
-
Vickerman, J., Swift, A. Secondary ion mass spectroscopy: the surface mass spectrometry. In Surface Analysis: The Principal Techniques, Ed., Vickerman, J.C. John Wiley & Sons: New York, 1997.
-
(1997)
Surface Analysis: The Principal Techniques
-
-
Vickerman, J.1
Swift, A.2
-
11
-
-
0005066217
-
Vibrational spectroscopy from surfaces
-
Ed., Vickerman, J.C. John Wiley & Sons, New York
-
Pemble, M. Vibrational spectroscopy from surfaces. In Surface Analysis: The Principal Techniques, Ed., Vickerman, J.C. John Wiley & Sons, New York, 1997, 267–307.
-
(1997)
Surface Analysis: The Principal Techniques
, pp. 267-307
-
-
Pemble, M.1
-
13
-
-
4444353793
-
Experimental verification of PCT diagrams for TiC and ZrC PVD coatings and determination of free carbon state by AES, XPS and HREELS methods
-
Kovalev, A.I., Wainstein, D.L., Karpman, M.G., Sidakhmedov, R.Kh. Experimental verification of PCT diagrams for TiC and ZrC PVD coatings and determination of free carbon state by AES, XPS and HREELS methods. Surface and Interface Analysis 2004, 36, 8, 1174–1177.
-
(2004)
Surface and Interface Analysis
, vol.36
, Issue.8
, pp. 1174-1177
-
-
Kovalev, A.I.1
Wainstein, D.L.2
Karpman, M.G.3
Sidakhmedov, R.4
-
14
-
-
4444280937
-
Investigation of the electronic structure of the phosphorus-doped Si and SiO2: Si quantum dots by XPS and HREELS methods
-
Kovalev, A.I., Wainstein, D.L., Tetelbaum, D.I., Hornig, W., Kucherenko, Yu. N. Investigation of the electronic structure of the phosphorus-doped Si and SiO2: Si quantum dots by XPS and HREELS methods. Surface and Interface Analysis 2004, 36, 8, 958–962.
-
(2004)
Surface and Interface Analysis
, vol.36
, Issue.8
, pp. 958-962
-
-
Kovalev, A.I.1
Wainstein, D.L.2
Tetelbaum, D.I.3
Hornig, W.4
Kucherenko, Y.U.5
-
15
-
-
0000474420
-
Semi-empirical molecular orbital methods, reviews
-
Eds., Lipkowitz, K.B., Boyd, D.B. VCH: New York
-
Zerner, M.C. Semi-empirical molecular orbital methods, reviews. In Computational Chemistry II, Eds., Lipkowitz, K.B., Boyd, D.B. VCH: New York, 1991, p. 313.
-
(1991)
Computational Chemistry II
, pp. 313
-
-
Zerner, M.C.1
-
17
-
-
0022659143
-
Evidence of extended fine structures in the Auger spectra: A new approach for surface structural studies
-
De Crescenzi, M., Chainet, E., Derrien, J. Evidence of extended fine structures in the Auger spectra: a new approach for surface structural studies. Solid State Commun. 1986, 57, 487.
-
(1986)
Solid State Commun
, vol.57
, pp. 487
-
-
De Crescenzi, M.1
Chainet, E.2
Derrien, J.3
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