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Volumn , Issue , 2006, Pages 81-120

Surface analysis techniques for investigations of modified surfaces, nanocomposites, chemical, and structure transformations

Author keywords

[No Author keywords available]

Indexed keywords


EID: 84866322944     PISSN: None     EISSN: None     Source Type: Book    
DOI: None     Document Type: Chapter
Times cited : (8)

References (17)
  • 1
    • 33244454403 scopus 로고    scopus 로고
    • SurfaceSpectra Ltd/I M Publications, Eds., Briggs, D., Grant, J.T., National Physical Laboratory: Teddington, U.K
    • Seah, M.P. Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy. SurfaceSpectra Ltd/I M Publications, Eds., Briggs, D., Grant, J.T., National Physical Laboratory: Teddington, U.K., 2003, pp. 167–189.
    • (2003) Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy , pp. 167-189
    • Seah, M.P.1
  • 3
    • 0036692774 scopus 로고    scopus 로고
    • Fine determination of inter-atomic distances on surface using extended energy-loss fine structure (EELFS) data: Peculiarities of the technique
    • Wainstein, D.L., Kovalev, A.I. Fine determination of inter-atomic distances on surface using extended energy-loss fine structure (EELFS) data: peculiarities of the technique. Surface and Interface Analysis 2002, 34, 230–233.
    • (2002) Surface and Interface Analysis , vol.34 , pp. 230-233
    • Wainstein, D.L.1    Kovalev, A.I.2
  • 4
    • 0000014708 scopus 로고
    • Auger and x-ray photoelectron spectroscopy
    • Eds., Briggs, D., Seah, M.P. John Wiley and Sons: Chichester
    • Sherwood, P.M.A. Auger and x-ray photoelectron spectroscopy. In Practical Surface Analysis, Auger and X-Ray Photoelectron Spectroscopy, 2nd ed., Vol. 1, Eds., Briggs, D., Seah, M.P. John Wiley and Sons: Chichester, 1990, p. 555.
    • (1990) Practical Surface Analysis, Auger and X-Ray Photoelectron Spectroscopy , vol.1 , pp. 555
    • Sherwood, P.M.A.1
  • 5
    • 0025632622 scopus 로고
    • EELFS method for investigation of equilibrium segregations on surfaces in steel and alloys
    • Kovalev, A.I., Mishina, V.P., Stsherbedinsky, G.V., Wainstein, D.L. EELFS method for investigation of equilibrium segregations on surfaces in steel and alloys. Vacuum 1990, 41, 7–9, 1794–1795.
    • (1990) Vacuum , vol.41 , Issue.7-9 , pp. 1794-1795
    • Kovalev, A.I.1    Mishina, V.P.2    Stsherbedinsky, G.V.3    Wainstein, D.L.4
  • 8
    • 0000881743 scopus 로고    scopus 로고
    • Secondary ion mass spectroscopy: The surface mass spectrometry
    • Ed., Vickerman, J.C. John Wiley & Sons: New York
    • Vickerman, J., Swift, A. Secondary ion mass spectroscopy: the surface mass spectrometry. In Surface Analysis: The Principal Techniques, Ed., Vickerman, J.C. John Wiley & Sons: New York, 1997.
    • (1997) Surface Analysis: The Principal Techniques
    • Vickerman, J.1    Swift, A.2
  • 11
    • 0005066217 scopus 로고    scopus 로고
    • Vibrational spectroscopy from surfaces
    • Ed., Vickerman, J.C. John Wiley & Sons, New York
    • Pemble, M. Vibrational spectroscopy from surfaces. In Surface Analysis: The Principal Techniques, Ed., Vickerman, J.C. John Wiley & Sons, New York, 1997, 267–307.
    • (1997) Surface Analysis: The Principal Techniques , pp. 267-307
    • Pemble, M.1
  • 13
    • 4444353793 scopus 로고    scopus 로고
    • Experimental verification of PCT diagrams for TiC and ZrC PVD coatings and determination of free carbon state by AES, XPS and HREELS methods
    • Kovalev, A.I., Wainstein, D.L., Karpman, M.G., Sidakhmedov, R.Kh. Experimental verification of PCT diagrams for TiC and ZrC PVD coatings and determination of free carbon state by AES, XPS and HREELS methods. Surface and Interface Analysis 2004, 36, 8, 1174–1177.
    • (2004) Surface and Interface Analysis , vol.36 , Issue.8 , pp. 1174-1177
    • Kovalev, A.I.1    Wainstein, D.L.2    Karpman, M.G.3    Sidakhmedov, R.4
  • 14
    • 4444280937 scopus 로고    scopus 로고
    • Investigation of the electronic structure of the phosphorus-doped Si and SiO2: Si quantum dots by XPS and HREELS methods
    • Kovalev, A.I., Wainstein, D.L., Tetelbaum, D.I., Hornig, W., Kucherenko, Yu. N. Investigation of the electronic structure of the phosphorus-doped Si and SiO2: Si quantum dots by XPS and HREELS methods. Surface and Interface Analysis 2004, 36, 8, 958–962.
    • (2004) Surface and Interface Analysis , vol.36 , Issue.8 , pp. 958-962
    • Kovalev, A.I.1    Wainstein, D.L.2    Tetelbaum, D.I.3    Hornig, W.4    Kucherenko, Y.U.5
  • 15
    • 0000474420 scopus 로고
    • Semi-empirical molecular orbital methods, reviews
    • Eds., Lipkowitz, K.B., Boyd, D.B. VCH: New York
    • Zerner, M.C. Semi-empirical molecular orbital methods, reviews. In Computational Chemistry II, Eds., Lipkowitz, K.B., Boyd, D.B. VCH: New York, 1991, p. 313.
    • (1991) Computational Chemistry II , pp. 313
    • Zerner, M.C.1
  • 17
    • 0022659143 scopus 로고
    • Evidence of extended fine structures in the Auger spectra: A new approach for surface structural studies
    • De Crescenzi, M., Chainet, E., Derrien, J. Evidence of extended fine structures in the Auger spectra: a new approach for surface structural studies. Solid State Commun. 1986, 57, 487.
    • (1986) Solid State Commun , vol.57 , pp. 487
    • De Crescenzi, M.1    Chainet, E.2    Derrien, J.3


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