Scanned light sheet microscopy with confocal slit detection

Optics Express

Volumn 20, Issue 19, 2012, Pages 21805-21814

  Baumgart, Eugen ^a   Kubitscheck, Ulrich ^a  

^a UNIVERSITY OF BONN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; FLUORESCENCE MICROSCOPY;

CMOS CAMERA; CONFOCAL IMAGING; FLUORESCENCE EXCITATION; HIGH FRAME RATE; ILLUMINATION BEAMS; IMAGE DATA; IMAGING PRINCIPLE; LIGHT SHEET; LINE DETECTION; LINESCANNING; OPTICAL SECTIONING; PHOTO-DAMAGE; SHEET-OF-LIGHT; SLIT DETECTORS;

DETECTORS;

EID: 84866252908     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.021805     Document Type: Article

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