Structures and optical properties of Zn 1-xNi xO nanoparticles by coprecipitation method

Research on Chemical Intermediates

Volumn 38, Issue 7, 2012, Pages 1483-1493

  Chauhan, Ruby ^a,b   Kumar, Ashavani ^c   Chaudhary, Ram Pal ^a  

^a SANT LONGOWAL INSTITUTE OF ENGINEERING AND TECHNOLOGY   (India)

^b Technology Education and Research Integrated Institutions   (India)

^c NATIONAL INSTITUTE OF TECHNOLOGY   (India)

Author keywords

Coprecipitation; Nanoparticles; Optical absorption; Scanning electron microscope; Transmission electron microscope; UV Vis spectrometer; XRD

Indexed keywords

AS ANNEALING; BAND-GAP VALUES; CALCINATION TEMPERATURE; COPRECIPITATION METHOD; CRYSTALLINE SIZE; HEXAGONAL WURTZITE STRUCTURE; NI-DOPED ZNO; NI-DOPING; OPTICAL ABSORPTION MEASUREMENT; RED SHIFT; SCANNING ELECTRON MICROSCOPE; SEM STUDY; TRANSMISSION ELECTRON MICROSCOPE; UV-VIS SPECTROMETER; UV-VISIBLE SPECTROMETERS; VISIBLE-LIGHT IRRADIATION; XRD; ZNO;

CALCINATION; COPRECIPITATION; CRYSTALLINE MATERIALS; LIGHT ABSORPTION; NANOCRYSTALS; NANOPARTICLES; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SPECTROMETERS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; ZINC; ZINC OXIDE; ZINC SULFIDE;

NICKEL;

EID: 84866089885     PISSN: 09226168     EISSN: 15685675     Source Type: Journal    
DOI: 10.1007/s11164-011-0478-5     Document Type: Article

References (26)

1. N. Golego, S.A. Studenikin, M. Cocivera, J. Electrochem. Soc. 147, 1592 (2000)
2. Y. Lin, Z. Zhang, Z. Tang, F. Yuan, J. Li, Adv. Mater. Opt. Electron 9, 206 (1999)
3. X. Wang, J. Song, J. Liu, Z.L. Wang, Science 316, 102 (2007)
4. K. Keren, R.S. Berman, E. Buchstab, U. Sivan, E. Braun, Science 302, 1380 (2003)
5. K. Nomura, H. Ohta, K. Ueda, T. Kamiya, M. Hirano, H. Hosono, Science 300, 1269 (2003)
6. T. Nakada, Y. Hirabayashi, T. Tokado, D. Ohmori, T. Mise, Sol. Energy 77, 739 (2004)
7. S.Y. Lee, E.S. Shim, H.S. Kang, S.S. Pang, J.S. Kang, Thin Solid Films 437, 31 (2005)
8. R. Könenkamp, R.C. Word, C. Schlegel, Appl. Phys. Lett. 85, 6004 (2004)
9. S.T. Mckinstry, P. Muralt, J. Electroceram. 12, 7 (2004)
10. Z.L. Wang, X.Y. Kong, Y. Ding, P. Gao, W.L. Hughes, R. Yang, Y. Zhang, Adv. Funct. Mater. 14, 943 (2004)
11. M.S. Wagh, L.A. Patil, T. Seth, D.P. Amalnerkar, Mater. Chem. Phys. 84, 228 (2004)
12. Y. Ushio, M. Miyayama, H. Yanagida, Sens. Actuators B17, 221 (1994)
13. H. Harima, J. Phys. Condens. Matter 16, S5653 (2004)
14. S.J. Pearton, W.H. Heo, M. Ivill, D.P. Norton, T. Steiner, Semicond. Sci. Technol. 19, R59 (2004)
15. M.A. Garcia, J.M. Merino, E.F. Pinel, A.J. Quesada, D. Venta, M.L.R. Gonza, G.R. Castro, P. Crespo, J. Llopis, J.M.G. Calbet, A. Hernando, Nano Lett. 7, 1489-1494 (2007)
16. Q.P. Zhong, E. Matijevic, J. Mater. Chem. 3, 443 (1996)
17. W. Lingna, M. Mamoun, J. Mater. Chem. 9, 2871 (1999)
18. D.W. Bhnemann, C. Kormann, M.R. Hoffmann, J. Phys. Chem. 9, 3789 (1987)
19. Z. Hui, Y. Deren, M. Xiangyang, J. Yujie, X. Jin, Nanotechnology 15, 622 (2004)
20. J. Zhang, L.D. Sun, J.L. Yin, Chem. Mater. 14, 4172 (2002)
21. W.J. Li, E.W. Shi, Z.W. Yin, J. Mater. Sci. Lett. 20, 1381 (2001)
22. A.O. Cadar, C. Roman, L. Gagea, B.A. Matei, I. Cernica, IEEE Xplore, 315 (2007)
23. S. Ekambaram, J. Alloys Compd. 390, L4-L6 (2005)
24. P.V. Radovanovic, D.R. Gamilin, Phys. Rev. Lett. 91, 157202 (2003)
25. S. Deka, P.A. Joy, Chem. Mater. 17, 6507 (2005)
26. J.I. Pankove, Optical Process in Semiconductors (Prentice-Hall, New Jersey, 1971)