Understanding oxygen reduction on tantalum oxyphosphate and tantalum oxide supported platinum by X-ray absorption spectroscopy

Journal of Physical Chemistry C

Volumn 116, Issue 34, 2012, Pages 18175-18183

  Korovina, Anna ^a   Garsany, Yannick ^b   Epshteyn, Albert ^c   Purdy, Andrew P ^c   More, Karren ^d   Swider Lyons, Karen E ^c   Ramaker, David E ^a  

^a GEORGE WASHINGTON UNIVERSITY   (United States)

^b EXCET INC   (United States)

^c NAVAL RESEARCH LABORATORY   (United States)

^d OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY DISPERSIVE X-RAY SPECTROSCOPY; HIGH RESOLUTION; HIGH TEMPERATURE; HIGH-ANGLE ANNULAR DARK FIELDS; IN-SITU; ISOLATION TECHNIQUES; MOLECULAR SPECIES; NANOSCALE LAYERS; ONSET POTENTIAL; OXYGEN REDUCTION; OXYGEN REDUCTION REACTION; OXYPHOSPHATES; POLYPHOSPHATES; PROTON CONDUCTION; PT NANOPARTICLES; PT PARTICLE; REDUCING CONDITIONS; ROTATING DISK ELECTRODES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; WATER ACTIVATION; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; XANES; XANES ANALYSIS;

ADSORPTION; ELECTROCATALYSTS; ELECTROLYTIC REDUCTION; ENERGY DISPERSIVE SPECTROSCOPY; HYDROGEN; NANOTECHNOLOGY; ROTATING DISKS; TANTALUM; TANTALUM OXIDES; TRANSMISSION ELECTRON MICROSCOPY; X RAY ABSORPTION SPECTROSCOPY;

PLATINUM;

EID: 84865781596     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp302023h     Document Type: Article

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