SCOPUS 정보 검색 플랫폼

Volumn 116, Issue 34, 2012, Pages 18533-18537

Promoting statistics of distributions in nanoscience: The case of improving yield strength estimates from ultrasound scission

(3) Vongehr, Sascha a Tang, Shaochun a Meng, Xiangkang a

a NANJING UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

DATA SUPPORT; ELONGATED NANOSTRUCTURE; FRAGMENT LENGTHS; HIGH-ENERGY PARTICLE PHYSICS; MATURE FIELDS; MEASUREMENT ACCURACY; MICRO MANIPULATION; REANALYSIS; STATISTICAL DISTRIBUTION; STATISTICAL ERRORS;

ERRORS; SYSTEMATIC ERRORS; ULTRASONICS; YIELD STRESS;

STATISTICS;

EID: 84865755221 PISSN: 19327447 EISSN: 19327455 Source Type: Journal
DOI: 10.1021/jp305785w Document Type: Article

Times cited : (5)

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