Characterization of a high coherence, Brillouin microcavity laser on silicon

Optics Express

Volumn 20, Issue 18, 2012, Pages 20170-20180

  Li, Jiang ^a   Lee, Hansuek ^a   Chen, Tong ^a   Vahala, Kerry J ^a  

^a California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICA;

BRILLOUIN; HIGH-ORDER; LASER LINE-WIDTH; LASER OPERATIONS; MICROCAVITY LASER; MICROWAVE SOURCES; OPTICAL GAIN SPECTRA; PHASE COHERENT; POTENTIAL APPLICATIONS; SCHAWLOW-TOWNES LINEWIDTH; SILICA-ON-SILICON; STIMULATED BRILLOUIN;

LINEWIDTH;

SILICON;

ARTICLE; CHEMISTRY; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; ELECTRONICS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INSTRUMENTATION; LASER; LIGHT; RADIATION SCATTERING; REFRACTOMETRY; THEORETICAL MODEL; TRANSDUCER;

COMPUTER SIMULATION; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LASERS; LIGHT; MINIATURIZATION; MODELS, THEORETICAL; REFRACTOMETRY; SCATTERING, RADIATION; SILICON; TRANSDUCERS;

EID: 84865749795     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.020170     Document Type: Article

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