Frequency noise of a microchip raman laser

2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009

Volumn , Issue , 2009, Pages

  Lu, Tao ^a   Yang, Lan ^a   Carmon, Tal ^a   Min, Bumki ^a   Vahala, Kerry ^a  

^a California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY NOISE; FUNDAMENTAL COMPONENT; MICRO-RAMAN LASERS; RAMAN LASERS; SCHAWLOW-TOWNES LINEWIDTH; SILICON CHIP; SPECTRAL COMPONENTS;

ELECTRON OPTICS; QUANTUM ELECTRONICS;

LASERS;

EID: 71049193411     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. A. Schawlow and C. H. Townes. "Infrared and Optical Masers," Phys. Rev. 112(6), 1940-1949 (1958).
2. L. Yang, T. Lu, T. Carmon, B. Min and K. J. Vahala. "A 4-Hz fundamental linewidth on-chip microlaser," CLEO (2007).
3. L. Yang, T. Carmon, B. K. Min, S. M. Spillane, and K. J. Vahala. "Erbium-doped and Raman microlasers on a silicon chip fabricated by the sol-gel process," Appl. Phys. Lett., 86, 091114 (2005).
4. D. K. Armani, T. J. Kippenberg, S. M. Spillane and K. J. Vahala. "Ultra-high-Q toroid microcavity on a chip," Nature 421, 925-928 (2003).
5. T. J. Kippenberg, S. M. Spillane, D. K. Armani, and K. J. Vahala. "Ultralow-threshold microcavity Raman laser on a microelectronic chip," Opt. Lett., 29(11), 1224-1227 (2004).
6. D. Derickson, Fiber Optic Test and Measurement, (Prentice Hall PTR, 1998).