Observations of fission-tracks in zircons by atomic force microscope

Radiation Measurements

Volumn 47, Issue 7, 2012, Pages 548-556

  Ohishi, Shinnosuke ^a   Hasebe, Noriko ^a  

^a KANAZAWA UNIVERSITY   (Japan)

Author keywords

Atomic force microscope; Etching; Fission track; Zircon

Indexed keywords

AFM; AFM IMAGE; ATOMIC FORCE MICROSCOPE (AFM); CHEMICAL EXPANSION; CONTACT MODES; DATING TECHNIQUES; DIFFERENCE IN SHARPNESS; ETCHING PERIODS; ETCHING RATE; ETCHING TIME; FINE GRAINED; FISSION TRACK; HIGH TRACK DENSITY; MINERAL SURFACES; OPTICAL MICROSCOPES; PER UNIT; SPONTANEOUS FISSION; TRACK DENSITY; URANIUM CONCENTRATION;

ETCHING; FISSION REACTIONS; MICROSCOPES; NANOCANTILEVERS; SILICATE MINERALS; URANIUM; ZIRCON;

ATOMIC FORCE MICROSCOPY;

EID: 84865690905     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.radmeas.2012.04.019     Document Type: Article

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