Analysis of short-range tracks and large track fluences in CR-39 PNTD using atomic force microscopy

Radiation Measurements

Volumn 44, Issue 9-10, 2009, Pages 742-745

  Johnson, C E ^a   Benton, E R ^a   Yasuda, N ^b   Benton, E V ^c  

^a OKLAHOMA STATE UNIVERSITY   (United States)

^b NATIONAL INSTITUTE OF RADIOLOGICAL SCIENCES   (Japan)

^c UNIVERSITY OF SAN FRANCISCO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM IMAGE; CHEMICAL ETCHING; ENERGETIC PROTONS; ETCHED TRACKS; FLUENCES; GEOMETRICAL PARAMETERS; LOMA LINDA UNIVERSITY MEDICAL CENTERS; MATRIX ANALYSIS; NUCLEAR RECOIL; NUCLEAR TRACK DETECTOR; OPTICAL MICROSCOPES; PROTON THERAPY; STANDARD IMAGES; STANDARD METHOD; VISIBLE LIGHT;

CAMERAS; IMAGE PROCESSING; MICROSCOPES; OPTICAL DATA PROCESSING; PROTONS; THREE DIMENSIONAL;

ATOMIC FORCE MICROSCOPY;

EID: 70949090294     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.radmeas.2009.10.080     Document Type: Article

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