On using asymmetry information for classification in extended dissimilarity spaces

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 7441 LNCS, Issue , 2012, Pages 503-510

  Plasencia Calaña, Yenisel ^a,b   García Reyes, Edel B ^a   Duin, Robert P W ^b   Orozco Alzate, Mauricio ^c  

^a ADVANCED TECHNOLOGIES APPLICATION CENTER   (Cuba)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c UNIVERSIDAD NACIONAL DE COLOMBIA   (Colombia)

Author keywords

asymmetric dissimilarity; dissimilarity spaces; extended dissimilarity spaces; prototype selection

Indexed keywords

ASYMMETRIC DISSIMILARITY; CLASSIFICATION ACCURACY; CORRECTION METHOD; DEGREE OF ASYMMETRY; DISSIMILARITY MEASURES; DISSIMILARITY SPACES; EXTENDED DISSIMILARITY SPACES; PATTERN RECOGNITION PROCEDURES; PROTOTYPE SELECTION;

COMPUTER VISION; IMAGE ANALYSIS; INFORMATION USE;

CLASSIFICATION (OF INFORMATION);

EID: 84865598233     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-642-33275-3_62     Document Type: Conference Paper

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