Infrared hemispherical reflectance of carbon nanotube mats and arrays in the 5-50 μm wavelength region

Carbon

Volumn 50, Issue 14, 2012, Pages 5348-5350

  Chunnilall, C J ^a   Lehman, J H ^b   Theocharous, E ^a   Sanders, A ^b  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON FILMS; REFLECTION; YARN;

CARBON NANOTUBE MATS; DIRECTIONAL HEMISPHERICAL REFLECTANCES; HEMISPHERICAL REFLECTANCE; INFRARED WAVELENGTHS; SILICON SUBSTRATES; VERTICALLY ALIGNED CARBON NANOTUBE; WAVELENGTH REGIONS;

CARBON NANOTUBES;

EID: 84865447545     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2012.07.014     Document Type: Letter

References (11)

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