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Volumn 49, Issue 2, 2012, Pages

Infrared hemispherical reflectance measurements in the 2.5νm to 50νm wavelength region using a Fourier transform spectrometer

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER TRANSFORM SPECTROMETERS; HEMISPHERICAL REFLECTANCE; INTERMEDIATE FIELDS; NATIONAL PHYSICAL LABORATORY; RELAY OPTICS; TEST SAMPLES; WAVELENGTH REGIONS;

EID: 84857934588     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/49/2/S73     Document Type: Review
Times cited : (7)

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  • 2
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  • 3
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  • 8
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