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Volumn 371, Issue , 2012, Pages
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Using TEM and XRD to probe crystal orientation in organic thin films grown with OMBD
a
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS CARBON;
AMORPHOUS FILMS;
CARBON;
CARBON FILMS;
COPPER;
CRYSTALLINE MATERIALS;
DEPOSITION;
ELECTRON MICROSCOPY;
ELECTRONS;
FIELD EFFECT TRANSISTORS;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
MOLECULAR BEAMS;
NITROGEN COMPOUNDS;
SUBSTRATES;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
COPPER PHTHALOCYANINE;
DOUBLE-LAYER FILMS;
LATTICE FRINGES;
ORGANIC MOLECULAR BEAM DEPOSITION;
ORGANIC THIN FILMS;
PERYLENE TETRACARBOXYLIC;
SUBSTRATE SURFACE;
X-RAY DIFFRACTION DATA;
CRYSTAL ORIENTATION;
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EID: 84865424768
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/371/1/012042 Document Type: Conference Paper |
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Times cited : (8)
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References (6)
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