On averaging force curves over heterogeneous surfaces in atomic force microscopy

Ultramicroscopy

Volumn 121, Issue , 2012, Pages 16-24

  Sokolov, I ^a   Kalaparthi, V ^a   Kreshchuk, M ^a   Dokukin, M E ^a  

^a CLARKSON UNIVERSITY   (United States)

Author keywords

Atomic force microscopy; Cell mechanics; Force processing; Long range forces; Nanomechanics

Indexed keywords

AFM; AVERAGE NUMBERS; BIOLOGICAL CELLS; BIOLOGICAL SURFACES; BIOMEDICAL APPLICATIONS; CELL MECHANICS; CERVICAL CANCERS; EPITHELIAL CELLS; FORCE CURVE; FORCE DATA; HETEROGENEOUS SURFACE; LONG-RANGE FORCES; MEASUREMENT ARTIFACTS; NANO SCALE; RIGIDITY MODULI; SURFACE RIGIDITY;

CELLS; MEDICAL APPLICATIONS; NANOMECHANICS; RIGIDITY; SURFACE CHEMISTRY;

ATOMIC FORCE MICROSCOPY;

ACCURACY; ARTICLE; ARTIFACT; ATOMIC FORCE MICROSCOPY; CANCER CELL; CELL SURFACE; CONTROLLED STUDY; EPITHELIUM CELL; ERROR; FEMALE; FORCE; HUMAN; HUMAN CELL; IMAGE PROCESSING; INTERMETHOD COMPARISON; MATHEMATICAL ANALYSIS; RIGIDITY; SURFACE PROPERTY; UTERINE CERVIX CANCER;

ARTIFACTS; BIOMECHANICS; CELL LINE, TUMOR; CERVIX UTERI; EPITHELIAL CELLS; FEMALE; HUMANS; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; SURFACE PROPERTIES;

EID: 84865090991     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.06.014     Document Type: Article

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