Structural and optical properties of AlxOy/Pt/Al xOy multilayer absorber

Materials Science and Engineering: B

Volumn 177, Issue 14, 2012, Pages 1194-1199

  Nuru, Z Y ^a,b   Arendse, C J ^b   Muller, T F G ^b   Maaza, M ^a  

^a NATIONAL RESEARCH FOUNDATION   (South Africa)

^b UNIVERSITY OF THE WESTERN CAPE   (South Africa)

Author keywords

Alumina; Evaporator; Microstructure; Multilayer absorber; Platinum; Spectral selectivity

Indexed keywords

ALUMINA; ALUMINUM OXIDE; ATOMIC FORCE MICROSCOPY; ATOMIC LAYER DEPOSITION; COATINGS; CRYSTAL ATOMIC STRUCTURE; CRYSTALLINE MATERIALS; ENERGY DISPERSIVE SPECTROSCOPY; HIGH TEMPERATURE APPLICATIONS; MULTILAYER FILMS; MULTILAYERS; OPTICAL MULTILAYERS; OPTICAL PROPERTIES; PLATINUM; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; X RAY DIFFRACTION;

COPPER SUBSTRATES; CRYSTALLINE PHASIS; ELECTRON BEAM DEPOSITIONS; MULTI-LAYER ABSORBERS; MULTILAYER STACKS; MULTILAYERS FILMS; PROPERTIES OF AL; RUTHERFORD BACKSCATTERING SPECTROMETRY; SPECTRAL SELECTIVITY; STRUCTURAL AND OPTICAL PROPERTIES;

MICROSTRUCTURE;

EID: 84864776265     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2012.05.028     Document Type: Article

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