메뉴 건너뛰기




Volumn 47, Issue 19, 2012, Pages 6768-6776

Hydrogen depth profile in phosphorus-doped, oxygen-free copper after cathodic charging

Author keywords

[No Author keywords available]

Indexed keywords

CATHODIC CHARGING; COPPER CANISTERS; DEPTH PROFILE; ELECTROLESS; GLOW DISCHARGE OPTICAL EMISSION SPECTROMETRIES; HIGH HYDROGEN PRESSURE; HYDROGEN CONTENTS; HYDROGEN PRESSURES; HYDROGEN UPTAKE; MAXIMUM PRESSURE; MELT EXTRACTION; OXYGEN FREE COPPER; PHOSPHORUS-DOPED; SPENT NUCLEAR FUELS;

EID: 84864767427     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-012-6592-y     Document Type: Article
Times cited : (47)

References (21)
  • 12
    • 0038605729 scopus 로고    scopus 로고
    • Glow discharge optical emission spectrometry: Moving towards reliable thin film analysis-A short review
    • Angeli J, Bengtson A, Bogaerts A, Hoffmann V, Hodoroaba VD, Steers E (2003) Glow discharge optical emission spectrometry: moving towards reliable thin film analysis-a short review. J Anal At Spectrom 18(6):670
    • (2003) J Anal at Spectrom , vol.18 , Issue.6 , pp. 670
    • Angeli, J.1    Bengtson, A.2    Bogaerts, A.3    Hoffmann, V.4    Hodoroaba, V.D.5    Steers, E.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.