Electrostatic force microscopy and spectral studies of electron attachment to single quantum dots on indium tin oxide substrates

Journal of Physical Chemistry C

Volumn 116, Issue 29, 2012, Pages 15847-15853

  Yalcin, Sibel Ebru ^a,b   Yang, Boqian ^a   Labastide, Joelle A ^a   Barnes, Michael D ^a  

^a UNIVERSITY OF MASSACHUSETTS   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED BIAS; CDSE/ZNS QUANTUM DOTS; DROP-CAST; ELECTRON ATTACHMENT; ELECTROSTATIC FORCE MICROSCOPY; EXCESS ELECTRONS; FLUORESCENCE ENERGY; INDIUM TIN OXIDE SUBSTRATES; PHOTOLUMINESCENCE IMAGING; QUANTUM CONFINED STARK EFFECT; RECOMBINATION ENERGY; RED SHIFT; SECOND ORDERS; SINGLE QUANTUM DOT; SPECTRAL MEASUREMENT; SPECTRAL MODULATION; SPECTRAL STUDIES; TIN DOPED INDIUM OXIDE;

ELECTRIC FORCE MICROSCOPY; ELECTRONS; ELECTROSTATIC FORCE; SEMICONDUCTOR QUANTUM DOTS; SEMICONDUCTOR QUANTUM WELLS; SPECTROSCOPIC ANALYSIS; TIN; TIN OXIDES;

ITO GLASS;

EID: 84864263012     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp305857d     Document Type: Article

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