Effect of Si-induced defects on 1 μm absorption losses in laser-grade YAG ceramics

Journal of Applied Physics

Volumn 111, Issue 9, 2012, Pages

  Gaume, R ^a,b   He, Y ^b   Markosyan, A ^b   Byer, R L ^b  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

^b STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION LOSS; BOUND POLARON; CHEMICAL TRACES; COMMON-PATH; HIGH SENSITIVITY; LINEAR CORRELATION; ND-DOPED; PHOTO-THERMAL; SI CONTENT; TRANSPARENT CERAMIC; YAG;

CERAMIC MATERIALS; COLOR CENTERS; GLOW DISCHARGES; LIGHT ABSORPTION; TRACE ANALYSIS;

SILICON;

EID: 84864222713     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4709756     Document Type: Article

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