Photothermal common-path interferometry (PCI): new developments

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7193, Issue , 2009, Pages

  Alexandrovski, Alexei ^a   Fejer, Martin ^b   Markosyan, Ashot ^b   Route, Roger ^b  

^a Stanford Photo Thermal Solutions   (United States)

^b STANFORD UNIVERSITY   (United States)

Author keywords

Absorption; GaAs; Photothermal technique

Indexed keywords

CALIBRATION STANDARD; COMMON-PATH; EXPERIMENTAL DATA; GAAS; MID-INFRARED REGIONS; NONTHERMAL; PHOTO-THERMAL; PHOTOTHERMAL SPECTROSCOPIES; PHOTOTHERMAL TECHNIQUE; PUMP BEAMS; RECENT PROGRESS; THEORETICAL MODELS;

ABSORPTION; COMPUTER PERIPHERAL EQUIPMENT; GALLIUM ALLOYS; INTERFACES (COMPUTER); LASER SPECTROSCOPY; MATERIALS TESTING; PHOSPHORUS; SEMICONDUCTING GALLIUM; SEMICONDUCTOR LASERS;

SOLID STATE LASERS;

EID: 66749144987     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.814813     Document Type: Conference Paper

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