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Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics

Volumn 30, Issue 4, 2012, Pages

Anomalous Rashba effect of bismuth(111) thin films studied by high-resolution spin- and angle-resolved photoemission spectroscopy

(4) Takayama, Akari a Sato, Takafumi a Souma, Seigo a Takahashi, Takashi a

a TOHOKU UNIVERSITY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; ELECTRIC DISCHARGES; SPECTROMETERS; SPECTROMETRY; SPIN POLARIZATION; THIN FILMS;

ANGLE RESOLVED PHOTOEMISSION SPECTROSCOPY; BISMUTH THIN FILMS; ENERGY RESOLUTIONS; HIGH RESOLUTION; OUT-OF-PLANE; PHOTOEMISSION SPECTROMETER; RASHBA EFFECTS; SI (1 1 1); SPIN STRUCTURES; SPIN TEXTURES; SURFACE HOLES; TIME REVERSAL SYMMETRIES; XENON PLASMA;

PHOTOELECTRON SPECTROSCOPY;

EID: 84864216737 PISSN: 21662746 EISSN: 21662754 Source Type: Journal
DOI: 10.1116/1.4731467 Document Type: Article

Times cited : (4)

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