Spectral encoding of spatial frequency approach for characterization of nanoscale structures

Applied Physics Letters

Volumn 101, Issue 3, 2012, Pages

  Alexandrov, Sergey A ^a   Uttam, Shikhar ^a   Bista, Rajan K ^a   Staton, Kevin ^a   Liu, Yang ^a  

^a UNIVERSITY OF PITTSBURGH SCHOOL OF MEDICINE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AXIAL PROFILES; AXIAL STRUCTURE; FUNDAMENTAL LIMITATIONS; IMAGE POINTS; NANO SCALE; NANOSCALE STRUCTURE; OPTICAL TECHNIQUE; SPATIAL FREQUENCY; SPECTRAL ENCODING; STRUCTURAL INFORMATION;

ENCODING (SYMBOLS); NANOTECHNOLOGY;

THREE DIMENSIONAL;

EID: 84864194179     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4737209     Document Type: Article

References (20)

1. R. M. Pasternack, Z. Qian, J. Y. Zheng, D. N. Metaxas, and N. N. Boustany, Opt. Express 17, 12001 (2009). 10.1364/OE.17.012001
2. S. A. Alexandrov, T. R. Hillman, and D. D. Sampson, Opt. Lett. 30, 3305 (2005). 10.1364/OL.30.003305
3. A. Wax, C. Yang, and J. A. Izatt, Opt. Lett. 28, 1230 (2003). 10.1364/OL.28.001230
4. L. T. Perelman, V. Backman, M. Wallace, G. Zonios, R. Manoharan, A. Nusrat, S. Shields, M. Seiler, C. Lima, T. Hamano, I. Itzkan, J. Van Dam, J. M. Crawford, and M. S. Feld, Phys. Rev. Lett. 80, 627 (1998). 10.1103/PhysRevLett. 80.627
5. V. Backman, M. B. Wallace, L. T. Perelman, J. T. Arendt, R. Gurjar, M. G. Muller, Q. Zhang, G. Zonios, E. Kline, T. McGillican, S. Shapshay, T. Valdez, K. Badizadegan, J. M. Crawford, M. Fitzmaurice, S. Kabani, H. S. Levin, M. Seiler, R. R. Dasari, I. Itzkan, J. Van Dam, and M. S. Feld, Nature 406, 35 (2000). 10.1038/35017638
6. H. F. Ding, Z. Wang, F. Nguyen, S. A. Boppart, and G. Popescu, Phys. Rev. Lett. 101, 238102 (2008). 10.1103/PhysRevLett.101.238102
7. E. Wolf, Opt. Commun. 1, 153 (1969). 10.1016/0030-4018(69)90052-2
8. M. Born and E. Wolf, Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light, 7th (expanded) ed. (Cambridge University Press, Cambridge, New York, 1999).
9. O. Haeberle, K. Belkebir, H. Giovaninni, and A. Sentenac, J. Mod. Opt. 57, 686 (2010). 10.1080/09500340.2010.493622
10. S. A. Alexandrov, T. R. Hillman, T. Gutzler, and D. D. Sampson, Phys. Rev. Lett. 97, 168102 (2006). 10.1103/PhysRevLett.97.168102
11. V. Mico, Z. Zalevsky, C. Ferreira, and J. Garcia, Opt. Express 16, 19260 (2008). 10.1364/OE.16.019260
12. A. Sentenac, P. C. Chaumet, and K. Belkebir, Phys. Rev. Lett. 97, 243901 (2006). 10.1103/PhysRevLett.97.243901
13. T. R. Hillman, T. Gutzler, S. A. Alexandrov, and D. D. Sampson, Opt. Express 17, 7873 (2009). 10.1364/OE.17.007873
14. S. A. Alexandrov and D. D. Sampson, J. Opt. A-Pure Appl. Opt. 10, 025304 (2008). 10.1088/1464-4258/10/2/025304
15. S. A. Alexandrov, S. Uttam, R. K. Bista, and Y. Liu, Opt. Lett. 36, 3323 (2011). 10.1364/OL.36.003323
16. See supplementary material at http://dx.doi.org/10.1063/1.4737209 E-APPLAB-101-019230 for additional clarification and also for cell preparation and TEM analysis.
17. K. Chen, A. Taflove, Y. L. Kim, and V. Backman, Appl. Phys. Lett. 86, 033101 (2005). 10.1063/1.1851002
18. P. Wang, R. Bista, R. Bhargava, R. E. Brand, and Y. Liu, Opt. Lett. 35, 2840 (2010). 10.1364/OL.35.002840
19. R. K. Bista, S. Uttam, P. Wang, K. Staton, S. Choi, C. J. Bakkenist, D. J. Hartman, R. E. Brand, and Y. Liu, J. Biomed. Opt. 16, 070503 (2011). 10.1117/1.3597723
20. L. A. Gao, R. T. Kester, N. Hagen, and T. S. Tkaczyk, Opt. Express 18, 14330 (2010). 10.1364/OE.18.014330