Effect of Y-doping on the electrical transport properties of nanocrystalline BiFeO 3

Journal of Applied Physics

Volumn 112, Issue 1, 2012, Pages

  Mukherjee, A ^a   Basu, S ^a   Chakraborty, G ^a   Pal, M ^b  

^a NATIONAL INSTITUTE OF TECHNOLOGY   (India)

^b CSIR CENTRAL MECHANICAL ENGINEERING RESEARCH INSTITUTE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AC CONDUCTIVITY; ARRHENIUS RELATIONS; CORRELATED BARRIER HOPPING; DC CONDUCTIVITY; DIELECTRIC PERMITTIVITIES; DIFFERENTIAL THERMAL ANALYZERS; ELECTRICAL TRANSPORT PROPERTIES; FIELD EMISSION SCANNING ELECTRON MICROSCOPES; GRAIN BOUNDARY RESISTANCE; NANOCRYSTALLINES; STATE OF THE ART; Y-DOPING; YTTRIUM DOPING;

ACTIVATION ENERGY; DIFFERENTIAL THERMAL ANALYSIS; ELECTRIC PROPERTIES; GRAIN BOUNDARIES; PERMITTIVITY; SOL-GELS; TRANSPORT PROPERTIES; X RAY DIFFRACTION; YTTRIUM;

YTTRIUM ALLOYS;

EID: 84864152342     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4734005     Document Type: Article

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