Effect of annealing on the structural, topographical and optical properties of sol-gel derived ZnO and AZO thin films

Materials Letters

Volumn 83, Issue , 2012, Pages 84-87

  Sengupta, Joydip ^a   Sahoo, R K ^b   Mukherjee, C D ^c  

^a SIKKIM MANIPAL INSTITUTE OF TECHNOLOGY   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY   (India)

^c SAHA INSTITUTE OF NUCLEAR PHYSICS   (India)

Author keywords

Annealing; Atomic force microscopy; AZO thin film; Optical properties; Sol gel preparation; X ray diffraction

Indexed keywords

AL-DOPED ZINC OXIDE; AL-DOPING; ANNEALING TEMPERATURES; AZO FILMS; AZO THIN FILMS; COMPARATIVE STUDIES; CRYSTALLINITIES; SOL GEL PREPARATIONS; TOPOGRAPHICAL MODIFICATIONS; UV-VISIBLE SPECTROPHOTOMETER; ZINC OXIDE (ZNO); ZNO;

ATOMIC FORCE MICROSCOPY; OPTICAL FILMS; OPTICAL PROPERTIES; SEMICONDUCTOR DOPING; SOL-GEL PROCESS; SOL-GELS; THIN FILMS; X RAY DIFFRACTION; ZINC OXIDE;

ANNEALING;

EID: 84864148513     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2012.05.130     Document Type: Article

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