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Volumn 41, Issue SUPPL.2, 2012, Pages 135-137
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Current mode atomic force microscopy (C-AFM) study for local electrical characterization of conjugated polymer blends
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Author keywords
Conjugated polymer; Current mode AFM; Polymer blends; Polymer solar cells
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTRICAL PROPERTY;
POLYMER;
SOLAR POWER;
SOLAR RADIATION;
POLY(3 HEXYLTHIOPHENE);
POLY(3-HEXYLTHIOPHENE);
POLYMER;
THIOPHENE DERIVATIVE;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMISTRY;
SOLAR ENERGY;
MICROSCOPY, ATOMIC FORCE;
POLYMERS;
SOLAR ENERGY;
THIOPHENES;
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EID: 84864020536
PISSN: 00447447
EISSN: None
Source Type: Journal
DOI: 10.1007/s13280-012-0269-2 Document Type: Conference Paper |
Times cited : (12)
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References (5)
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