Nanoscale chemical composition mapping of polymers at 100nm spatial resolution with AFM-based IR spectroscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8373, Issue , 2012, Pages

  Lo, Michael ^a   Prater, Craig ^a   Dazzi, Alexandre ^b   Shetty, Roshan ^a   Kjoller, Kevin ^a  

^a Anasys Instruments   (United States)

^b UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL COMPOSITIONS; IR SPECTRUM; NANO SCALE; POLYMER CRYSTALLINITY; SOLUTION CAST; SPATIAL RESOLUTION; SPATIAL SCALE; SPECTRAL REGION; SPECTROSCOPIC CHARACTERIZATION; SUBMICRON;

ATOMIC FORCE MICROSCOPY; IMAGE RESOLUTION; NANOTECHNOLOGY; SENSORS;

POLYMERS;

EID: 84863888471     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.919809     Document Type: Conference Paper

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