Sulfidation mechanism of pure and Cu-doped ZnO nanoparticles at moderate temperature: TEM and in situ XRD studies

Journal of Physical Chemistry C

Volumn 116, Issue 27, 2012, Pages 14423-14430

  Bezverkhyy, Igor ^a   Skrzypski, Jonathan ^a   Safonova, Olga ^b   Bellat, Jean Pierre ^a  

^a UNIVERSITÉ DE BOURGOGNE   (France)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COMPENSATION; CRYSTALLINE GROWTH; CU-DOPED SAMPLE; CU-DOPED ZNO; EXTERNAL SURFACES; HIGH MOBILITY; IN-SITU SYNCHROTRONS; IN-SITU XRD; KIRKENDALL EFFECTS; MODERATE TEMPERATURE; NANO-SIZED; NON-DOPED; PARTIAL REACTIONS; SULFIDATION; TIME-RESOLVED; TRANSFORMATION MECHANISMS; TRANSMISSION ELECTRON MICROSCOPY TEM; XRD; ZNO;

COPPER; GRAIN BOUNDARIES; IONS; METAL NANOPARTICLES; SULFUR; TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDE; ZINC SULFIDE;

ZINC;

EID: 84863854955     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp303181d     Document Type: Article

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