Spectral-interference microscopy for characterization of functional plasmonic elements

Optics Express

Volumn 20, Issue 13, 2012, Pages 14632-14647

  Rewitz, Christian ^a   Keitzl, Thomas ^a   Tuchscherer, Philip ^a   Goetz, Sebastian ^a   Geisler, Peter ^a   Razinskas, Gary ^a   Hecht, Bert ^a   Brixner, Tobias ^a  

^a UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

NANOSTRUCTURES; PRECIOUS METALS;

CONFOCAL MICROSCOPES; DATA EVALUATION; GROUP VELOCITIES; INTEGRATED OPTICAL CIRCUIT; NANO-METER-SCALE; NON-LINEAR PHENOMENA; PLASMONIC; SIGNAL DELAYS; SILVER NANOWIRES; SPATIAL RESPONSE FUNCTIONS; SPECTRAL INTERFEROMETRY; SUB-WAVELENGTH; TIMING INFORMATION;

PLASMONS;

ARTICLE; MATERIALS TESTING; METHODOLOGY; PHASE CONTRAST MICROSCOPY; SURFACE PLASMON RESONANCE;

MATERIALS TESTING; MICROSCOPY, INTERFERENCE; SURFACE PLASMON RESONANCE;

EID: 84863746489     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.014632     Document Type: Article

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