New scanning tunneling microscopy technique enables systematic study of the unique electronic transition from graphite to graphene

Carbon

Volumn 50, Issue 12, 2012, Pages 4633-4639

  Xu, P ^a   Yang, Yurong ^a,b   Barber, S D ^a   Schoelz, J K ^a   Qi, D ^a   Ackerman, M L ^a   Bellaiche, L ^a   Thibado, P M ^a  

^a UNIVERSITY OF ARKANSAS   (United States)

^b NANJING UNIVERSITY OF AERONAUTICS AND ASTRONAUTICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC-RESOLUTION; ELECTRONIC TRANSITION; FIRST-PRINCIPLES CALCULATION; HIGHLY ORIENTED PYROLYTIC GRAPHITE; NOVEL TECHNIQUES; STM IMAGES; SYSTEMATIC STUDY; VERTICAL DISPLACEMENTS; VERTICAL MOVEMENT;

CALCULATIONS; GRAPHENE; SCANNING TUNNELING MICROSCOPY;

GRAPHITE;

EID: 84863715595     PISSN: 00086223     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.carbon.2012.05.050     Document Type: Article

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