Impact of thermal annealing on the semicrystalline nanomorphology of spin-coated thin films of regioregular poly(3-alkylthiophene)s as observed by high-resolution transmission electron microscopy and grazing incidence X-ray diffraction

Macromolecules

Volumn 45, Issue 13, 2012, Pages 5575-5585

  Salammal, Shabi Thankaraj ^a   Mikayelyan, Eduard ^a   Grigorian, Souren ^a   Pietsch, Ullrich ^a   Koenen, Nils ^b   Scherf, Ullrich ^b   Kayunkid, Navaphun ^c   Brinkmann, Martin ^c  

^a UNIVERSITY OF SIEGEN   (Germany)

^b UNIVERSITY OF WUPPERTAL   (Germany)

^c UNIVERSITÉ DE STRASBOURG   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALKYL SIDE CHAINS; ANNEALING TEMPERATURES; CARBON ATOMS; DATA YIELDS; FIELD-EFFECT MOBILITIES; GRAZING INCIDENCE X-RAY DIFFRACTION; LATERAL DIMENSION; LATERAL GROWTH; LOW DOSE; NANO DOMAIN; NANOMORPHOLOGIES; POLY(3-ALKYLTHIOPHENE); REGIO-REGULAR; SEMICRYSTALLINES; SIDE-CHAINS; SPIN-COATED THIN FILMS; STEM LENGTH; THERMAL-ANNEALING; VAN DER WAALS INTERACTIONS;

NANOCRYSTALS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VAN DER WAALS FORCES; X RAY DIFFRACTION;

ANNEALING;

EID: 84863711819     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma300906v     Document Type: Article

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