Emerging memory technology perspective

International Symposium on VLSI Technology, Systems, and Applications, Proceedings

Volumn , Issue , 2012, Pages

  Bez, Roberto ^a   Cappelletti, Paolo ^a  

^a Micron   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC SYSTEMS; INDUSTRY STANDARDS; MEMORY DENSITY; MEMORY TECHNOLOGY; NEW APPLICATIONS;

TECHNOLOGY;

DYNAMIC RANDOM ACCESS STORAGE;

EID: 84863691696     PISSN: 19308868     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSI-TSA.2012.6210106     Document Type: Conference Paper

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