SCOPUS 정보 검색 플랫폼

Volumn 66, Issue 5, 2012, Pages

Ultra-low-energy electron scattering cross section measurements of Ar, Kr and Xe employing the threshold photoelectron source

(10) Kitajima, M a Kurokawa, M a,d Kishino, T a Toyoshima, K a Odagiri, T a Kato, H b Anzai, K b Hoshino, M b Tanaka, H b Ito, K c

a TOKYO INSTITUTE OF TECHNOLOGY (Japan)

b SOPHIA UNIVERSITY (Japan)

c INSTITUTE OF MATERIALS STRUCTURE SCIENCE (Japan)

d HITACHI LTD (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

PHOTOELECTRONS; PHOTONS;

ELECTRON SWARM; EXPERIMENTAL TECHNIQUES; LOW ENERGY REGIONS; MEASUREMENTS OF; MODIFIED EFFECTIVE RANGE THEORIES; MOMENTUM TRANSFER CROSS SECTIONS; PHOTOELECTRON SOURCE; ULTRA LOW ENERGY;

ELECTRON SCATTERING;

EID: 84863653094 PISSN: 14346060 EISSN: 14346079 Source Type: Journal
DOI: 10.1140/epjd/e2012-20629-0 Document Type: Article

Times cited : (13)

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