High-resolution total-cross-section measurements for electron scattering from Ar, Kr, and Xe employing a threshold-photoelectron source

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 84, Issue 6, 2011, Pages

  Kurokawa, M ^a,d   Kitajima, M ^a   Toyoshima, K ^a   Kishino, T ^a   Odagiri, T ^a   Kato, H ^b   Hoshino, M ^b   Tanaka, H ^b   Ito, K ^c  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b SOPHIA UNIVERSITY   (Japan)

^c INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^d HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGIES; ENERGY RESOLUTIONS; EXPERIMENTAL TECHNIQUES; FESHBACH RESONANCES; HIGH RESOLUTION; MODIFIED EFFECTIVE RANGE THEORIES; RESONANT SCATTERING; RESONANT STRUCTURES; SCATTERING LENGTH; TOTAL CROSS SECTION;

ELECTRON SCATTERING; EXPERIMENTS; PHOTONS;

ELECTRONS;

EID: 84855266325     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.84.062717     Document Type: Article

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