Time- and energy resolved photoemission electron microscopy-imaging of photoelectron time-of-flight analysis by means of pulsed excitations

Journal of Electron Spectroscopy and Related Phenomena

Volumn 178-179, Issue C, 2010, Pages 317-330

  Oelsner, Andreas ^a   Rohmer, Martin ^b   Schneider, Christian ^b   Bayer, Daniela ^b   Schönhense, Gerd ^c   Aeschlimann, Martin ^b  

^a SURFACE CONCEPT GMBH   (Germany)

^b Rheinland Pfälzische Technische Universität Kaiserslautern Landau   (Germany)

^c JOHANNES GUTENBERG UNIVERSITY   (Germany)

Author keywords

Delay line detector; Photoemission electron microscopy; Time of flight; Time resolved photoemission

Indexed keywords

4D IMAGING; ABERRATION CORRECTION; ATTOSECOND TIME SCALE; BASIC PRINCIPLES; DATA LOSS; DELAY-LINE DETECTORS; DYNAMIC PHENOMENA; DYNAMICAL PROCESS; FEMTOSECONDS; HEMISPHERICAL ENERGY ANALYZER; MEASUREMENT SPEED; ON TIME; OPTICAL NEAR FIELD; PHOTOEMISSION ELECTRON MICROSCOPY; PHOTOEMITTED ELECTRONS; PULSED EXCITATION; PUMP-PROBE EXPERIMENTS; REAL-TIME EXPERIMENT; REAL-TIME OBSERVATION; SLICED IMAGES; SPACE CHARGES; SPATIALLY RESOLVED; SPECTROSCOPIC IMAGING; TIME OF FLIGHT; TIME OF FLIGHT ANALYSIS; TIME RESOLUTION; TIME-RESOLVED; TIME-SCALES; WORK FOCUS;

DETECTORS; ELECTRONS; MAGNETIC DOMAINS; PHOTOEMISSION; PHOTOIONIZATION; PHOTONS; PULSED LASER APPLICATIONS; PUMPING (LASER); SCANNING ELECTRON MICROSCOPY; WAVES;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 77951024477     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2009.10.008     Document Type: Article

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